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  • Analysis of Off-the-Shelf Semiconductor Devices
    Webinar: Analysis of Off-the-Shelf Semiconductor Devices

    martes, marzo 17, 2026 22 días transcurridos

    This webinar demonstrates how atom probe tomography provides quantitative, three‑dimensional insights into off‑the‑shelf semiconductor devices, supporting failure analysis, benchmarking, and advanced device characterization.

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  • Magnetically Confined and Atom Probe Defined: how APT helps to solve the fusion materials challenge
    Webinar: Magnetically Confined and Atom Probe Defined: How APT Helps to Solve the Fusion Materials Challenge

    miércoles, febrero 18, 2026 49 días transcurridos

    Discover how magnetic confinement enhances atom probe tomography performance by improving ion trajectory stability, mass resolution, and quantitative 3D nanoscale analysis across complex materials.

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  • Matrix effet and mineral characterisation for LG-SIMS by Laure Martin
    Webinar: Matrix effects and mineral characterization on LG-SIMS

    martes, febrero 10, 2026 57 días transcurridos

    Laure Martin (UWA) presented the fundamentals and challenges of matrix effects on LG‑SIMS, illustrated with examples from the lab and literature, and provided practical strategies to improve quantification accuracy and data reliability in SIMS analysis.

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  • Dr. Niculina Musat webinar
    Webinar: Imaging Microbial Life at the Nanoscale: How NanoSIMS Reveals Single-Cell Function

    miércoles, febrero 4, 2026 63 días transcurridos

    A special webinar celebrated the International Day of Women and Girls in Science. Dr. Niculina Musat showcased how NanoSIMS reveals single‑cell microbial activity within complex communities, highlighting key methods, recent advances, and real‑world case studies.

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  • Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors
    Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors

    viernes, enero 23, 2026 75 días transcurridos

    Explore how atom probe tomography uncovers nanoscale chemistry in MLCCs—from core–shell architecture to grain boundary segregation and Ni–ceramic interfaces—using the latest CAMECA innovations.

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  • Facility Opening & Inaugural Symposium
    Invizo 6000 inauguration at National University of Singapore

    miércoles, enero 21, 2026 77 días transcurridos

    National University of Singapore (NUS) Unveils First Invizo 6000 Atom Probe Facility in ASEAN, Marking a Major Leap in 3D Atomic‑Scale Materials Analysis

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  • Analysis of Hydrogen in Semiconductor Materials application note
    Análisis de hidrógeno en materiales semiconductores – Nota de aplicación

    lunes, enero 19, 2026 79 días transcurridos

    Descubra cómo el IMS 7f-Auto de CAMECA ofrece una sensibilidad SIMS inigualable para el perfilado de profundidad de hidrógeno en silicio y GaAs. Garantice la precisión de las mediciones, la trazabilidad y el cumplimiento de las normas ISO para la innovación en semiconductores.

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