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  • AI-Assisted Automated Acquisition Control for Atom Probe Tomography
    Webinar: AI-Assisted Automated Acquisition Control for Atom Probe Tomography

    viernes, agosto 28, 2026 47 días transcurridos

    Learn how generative AI can help develop advanced APT acquisition workflows with less coding effort, enabling improved specimen yield, faster optimization, and more efficient atom probe experiments.

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  • Society’s Distinguished Scientist Award will be presented to the Fellows at the M&M 2026 conference in Milwaukee, WI
    Dr. David J. Larson Named 2026 Fellow of the Microanalysis Society

    jueves, julio 30, 2026 76 días transcurridos

    Dr. David J. Larson, Director of Strategic Initiatives at CAMECA, will be inducted as a 2026 Microanalysis Society (MAS) Fellow at M&M 2026, recognizing his pioneering contributions to atom probe science and technology.

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  • Webinar: Ask Us Anything: Atom Probe Edition
    Webinar: Ask Us Anything: Atom Probe Edition

    martes, junio 16, 2026 120 días transcurridos

    Join CAMECA’s interactive “Ask Us Anything: Atom Probe” webinar to get expert answers on atom probe tomography (APT), from specimen preparation to data analysis and interpretation.

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  • M&M 2026
    APT User’s Meeting & Pre-Meeting Congress (PMC)

    lunes, junio 8, 2026 128 días transcurridos

    Join the APT User’s Meeting & PMC workshop for two days of technical insights, correlative workflows, and the latest advances in Atom Probe Tomography.

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  • Characterization of extraterrestrial materials at the sub-micrometer scale by NanoSIMS
    Webinar: Characterization of extraterrestrial materials at the sub-micrometer scale by NanoSIMS

    miércoles, mayo 20, 2026 147 días transcurridos

    Explore how NanoSIMS reveals the origin of extraterrestrial materials. Learn how presolar grains provide unique insights into stellar nucleosynthesis and the chemical evolution of our galaxy through high-resolution isotopic analysis.

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  • Introduction to APT webinar
    Webinar: Introduction to Atom Probe Tomography (APT) and its Historical and New Materials Applications 

    lunes, mayo 11, 2026 156 días transcurridos

    Introduction to Atom Probe Tomography (APT) and its applications, exploring how nanoscale 3D compositional analysis reveals the link between atomic structure and material properties.

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  • Analysis of Off-the-Shelf Semiconductor Devices
    Webinar: Analysis of Off-the-Shelf Semiconductor Devices

    martes, marzo 17, 2026 211 días transcurridos

    This webinar demonstrates how atom probe tomography provides quantitative, three‑dimensional insights into off‑the‑shelf semiconductor devices, supporting failure analysis, benchmarking, and advanced device characterization.

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  • Magnetically Confined and Atom Probe Defined: how APT helps to solve the fusion materials challenge
    Webinar: Magnetically Confined and Atom Probe Defined: How APT Helps to Solve the Fusion Materials Challenge

    miércoles, febrero 18, 2026 238 días transcurridos

    Discover how magnetic confinement enhances atom probe tomography performance by improving ion trajectory stability, mass resolution, and quantitative 3D nanoscale analysis across complex materials.

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  • Matrix effet and mineral characterisation for LG-SIMS by Laure Martin
    Webinar: Matrix effects and mineral characterization on LG-SIMS

    martes, febrero 10, 2026 246 días transcurridos

    Laure Martin (UWA) presented the fundamentals and challenges of matrix effects on LG‑SIMS, illustrated with examples from the lab and literature, and provided practical strategies to improve quantification accuracy and data reliability in SIMS analysis.

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  • Dr. Niculina Musat webinar
    Webinar: Imaging Microbial Life at the Nanoscale: How NanoSIMS Reveals Single-Cell Function

    miércoles, febrero 4, 2026 252 días transcurridos

    A special webinar celebrated the International Day of Women and Girls in Science. Dr. Niculina Musat showcased how NanoSIMS reveals single‑cell microbial activity within complex communities, highlighting key methods, recent advances, and real‑world case studies.

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  • Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors
    Webinar: Atom Probe Characterization of Multi-Layer Ceramic Capacitors

    viernes, enero 23, 2026 264 días transcurridos

    Explore how atom probe tomography uncovers nanoscale chemistry in MLCCs—from core–shell architecture to grain boundary segregation and Ni–ceramic interfaces—using the latest CAMECA innovations.

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  • Facility Opening & Inaugural Symposium
    Invizo 6000 inauguration at National University of Singapore

    miércoles, enero 21, 2026 266 días transcurridos

    National University of Singapore (NUS) Unveils First Invizo 6000 Atom Probe Facility in ASEAN, Marking a Major Leap in 3D Atomic‑Scale Materials Analysis

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  • Analysis of Hydrogen in Semiconductor Materials application note
    Análisis de hidrógeno en materiales semiconductores – Nota de aplicación

    lunes, enero 19, 2026 268 días transcurridos

    Descubra cómo el IMS 7f-Auto de CAMECA ofrece una sensibilidad SIMS inigualable para el perfilado de profundidad de hidrógeno en silicio y GaAs. Garantice la precisión de las mediciones, la trazabilidad y el cumplimiento de las normas ISO para la innovación en semiconductores.

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